Browsing “Non-Classifiable” for "aaom" (Showing 1 - 2 of 2 results)

Subjects

  • Synthetic Polymeric Membranes

    Characterization by Atomic Force Microscopy
    by K. C. Khulbe; C. Y. Feng; Takeshi Matsuura
    • Format: Fixed
    • From $29.70 USD

  • Atomic Force Microscopy, Scanning Nearfield Optical Micro...

    Application to Rough and Natural Surfaces
    by Gerd Kaupp
    • Format: Fixed
    • From $62.70 USD
Showing 1 - 2 of 2 results